PARK NX15

Large Sample AFM

PARK NX15

The versatile nanometrology tool for advanced research

PARK NX15

Description:

Park NX15 is a versatile atomic force microscope (AFM) engineered for dependable performance. Its sample stage accommodates full coverage of wafers up to 150 mm, providing a reliable platform for nanoscale metrology in semiconductor and materials research.
The core technology of NX15 lies in Park’s proprietary orthogonal scan system and True Non-contact™ mode. These innovations virtually eliminate lateral motion artifacts while protecting both tip and sample, enabling artifact-free, high-resolution imaging even for delicate or challenging specimens.
From materials science and semiconductors to polymers and bioengineering, NX15 delivers robust performance and dependable results, making it a trusted platform for advanced nanoscale metrology.
Key Features:

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