Profilometer

Profilometers operate based on two main principles: contact and non-contact methods. Contact profilometers, such as stylus profilometers, employ a diamond or hard stylus that physically traces the surface, measuring the vertical displacement of the stylus as it moves across the surface. Non-contact profilometers, like optical profilometers and laser profilometers, use optical or laser-based techniques to measure the surface profile without physical contact.

A stylus profilometer is a type of contact profilometer that uses a physical stylus or probe to trace the surface of a material and measure its surface topography and roughness. It is one of the most widely used and versatile instruments for surface characterization.

Stylus profilometers consist of a highly precise mechanical system that moves a diamond or other hard stylus across the surface of the sample. As the stylus traverses the surface, its vertical displacement is measured and recorded, providing a detailed profile of the surface features, including roughness, waviness, and other irregularities.

The working principle of a stylus profilometer is based on the physical interaction between the stylus and the sample surface. The stylus is mounted on a lightweight arm or cantilever, which is connected to a transducer that detects the vertical movement of the stylus as it traces the surface.

The sample is placed on a motorized stage that moves in a precisely controlled manner, either linearly or in a serpentine pattern, allowing the stylus to scan across the surface. As the stylus encounters surface irregularities, its vertical displacement is converted into an electrical signal by the transducer, typically using capacitive, inductive, or optical techniques.

The electrical signal is then amplified, processed, and digitized, allowing the surface profile data to be displayed, analyzed, and quantified using specialized software. Various surface roughness parameters, such as Ra (arithmetic average roughness), Rz (average maximum height of the profile), and Rq (root mean square roughness), can be calculated from the collected data.

Optical profilometers are non-contact instruments that use optical techniques to measure and analyze the surface topography of materials without physically touching the surface. They offer several advantages over contact profilometers, such as non-destructive measurement and the ability to measure soft or delicate surfaces.

Optical profilometers employ various optical principles, including interferometry, confocal microscopy, or focus variation, to measure the surface profile. These instruments typically consist of an optical system, a light source, and a detector or image sensor, along with specialized software for data acquisition and analysis.

The working principle of optical profilometers varies depending on the specific technique employed, but they generally rely on the interaction between light and the sample surface.

• Interferometric Profilometers: These instruments use the interference pattern created by the superposition of two or more light waves to measure surface heights. The interference pattern is analyzed to determine the surface topography with high precision.
• Confocal Microscopy Profilometers: These profilometers use a confocal microscope setup, where a pinhole aperture is used to eliminate out-of-focus light. By scanning the focal plane across the sample surface, a three-dimensional image of the surface can be reconstructed.
• Focus Variation Profilometers: These instruments operate by analyzing the focus variation of an optical system as it scans across the surface. The focus level is correlated with the surface height, allowing the reconstruction of the surface topography.

In all cases, the optical system collects and processes the light reflected or scattered from the sample surface, generating a digital representation of the surface profile. Advanced algorithms and software are used to analyze the data and extract various surface roughness parameters, as well as generate three-dimensional visualizations of the surface.

• Surface roughness analysis of aircraft components
• Coating thickness measurement on turbine blades
• Wear analysis of landing gear components
• Inspection of airfoil surface quality

• Surface finish evaluation of body panels
• Paint quality assessment on automotive coatings
• Friction analysis of brake pad surfaces
• Surface characterization of engine components

• Surface topography characterization of catalysts
• Corrosion studies on chemical processing equipment
• Adhesion analysis of protective coatings
• Surface inspection of chemical storage tanks

• Display surface quality control
• Surface defect detection on smartphone screens
• Scratch resistance testing of device casings
• Inspection of optical surface finishes

• Ballistic protection surface analysis
• Camouflage surface evaluation
• Weapon component inspection
• Surface characterization of armour materials

• Turbine blade surface monitoring
• Solar panel surface characterization
• Pipeline inspection for corrosion and defects
• Surface analysis of wind turbine components

• Forensic evidence analysis
• Tool mark identification
• Footprint analysis
• Ballistic mark examination

• LED chip surface quality control
• Reflector surface evaluation
• Diffuser surface measurement
• Lens surface inspection

• Implant surface characterization
• Orthopaedic device surface analysis
• Dental prosthetic evaluation
• Surface analysis of medical instruments

• Tablet surface roughness analysis
• Coating uniformity assessment
• Container surface inspection
• Surface characterization of drug delivery devices

• Surface quality control
• Defect detection
• Wear resistance analysis
• Texture characterization

• Wafer surface monitoring
• Integrated circuit surface characterization
• Interconnect surface inspection
• Nanoscale surface metrology

• Hard disk surface quality control
• Optical fiber surface evaluation
• Connector surface analysis
• Surface inspection of telecommunication components d turbine components

• Quantitative surface analysis: Profilometers provide precise and quantitative measurements of surface roughness, waviness, and other topographical features.
• High resolution: Modern profilometers can achieve nanometer-level resolution, allowing for detailed analysis of even the smallest surface features.
• Non-destructive testing: Non-contact profilometers enable surface analysis without damaging or altering the sample.
• Versatility: Profilometers can be used to characterize a wide range of materials, including metals, ceramics, polymers, and composites.

• Maximum sample size: 300 mm diameter.
• Film Thickness: 2 µm – 150 µm thick.