PARK FX200

Large Sample AFM

PARK FX200

The most advanced AFM for 200 mm samples

PARK FX200

Description:

Park FX200 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed to accommodate samples up to 200 mm. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX200 delivers unmatched precision and reliability.
Like all Park AFMs, FX200 features an orthogonal scan system and True Non-contact™ mode, enabling accurate, high-resolution metrology, even on the most delicate or fragile samples.
Key features of FX200 include automatic probe exchange, automatic laser beam alignment, and a full 200 mm sample view camera; the signatures of FX-series AFMs that streamline operation while significantly enhancing productivity. Additional capabilities such as automated scan parameter optimization, optical autofocus, sequential measurements across multiple positions, and powerful data analysis tools further simplify even the most complex workflows.
With advanced capabilities and a user-friendly interface, the FX200 offers a versatile solution for nanoscale imaging and analysis across both research and industrial settings.
Key Features:

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