Surface & Nano Characterization
Profilometer
Optical Profilometry: Precisely Analyze Surfaces | GBS
In industrial environments and research, reliable surface measurement plays a central role. Precise 3D measurement data form the basis for manufacturing processes, quality control, and product development.
Profilometry allows complex surface structures to be captured and analyzed. Our modern systems are capable of performing these tasks with high speed, resolution, and flexibility. This enables companies to secure their manufacturing processes and develop innovative products.
Profilometry refers to the quantitative measurement and analysis of surface structures. This method records height profiles and topographical data to accurately determine roughness, waviness, and microstructures. In practice, a distinction is made between tactile and optical methods.
Our smartWLI technology
Our 3D surface metrology technology is based on powerful white light interferometry and sets standards in non-contact optical metrology. Through continuous research and technological development, we offer systems that capture even the finest surface structures with the highest accuracy and in real time.
In this section, we present the key features of our smartWLI technology—from GPU-based data processing and exceptional height and lateral resolution to innovative functions such as the extended acceptance angle and automated quality control of the point cloud (AQC).
Learn how our technology overcomes the limitations of traditional interferometry and sets new standards for efficiency, precision, and user-friendliness in surface measurement technology.
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