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X-Ray Diffraction
X-Ray Diffraction
X-Ray Diffraction is a powerful non-destructive technique used for phase identification, phase quantification, crystallinity assessment, unit cell deciphering, and polymorphism exploration of crystalline material. This structure, in turn, exerts a profound influence on the material’s physical and chemical properties, impacting its performance in various applications.
The XRD technique works on the principle of constructive interference of the diffracted rays by the crystalline sample. Monochromatic X-Rays are directed towards the sample, and the diffracted beams are captured by a detector. When the diffracted X-rays satisfy Bragg’s Law, constructive interference occurs
[ n λ = 2d sin θ ]
The constructive interference produces the diffraction peaks. The diffraction peaks have been collected to the possible specific angles (2θ), generating a characteristic XRD pattern. This pattern serves as a unique identification for each material.
Types of X-Ray Diffractions:XRD encompasses various techniques, each tailored to specific sample types:
- Powder X-ray Diffraction (PXRD): Reigning supreme as the most common XRD technique, PXRD excels in analysing polycrystalline powder samples. Simple Sample Preparation Its simple sample preparation makes it ideal for determining polymorphism, crystallinity, and phase composition across a broad range of applications.
- Grazing Incidence X-ray Diffraction (GIXRD): GIXRD emerges as the go-to technique for investigating thin film materials Incident Angle Manipulation: By manipulating the incident angle of the X-ray beam, GIXRD controls the penetration depth, providing surface-sensitive structural information. Thin Film Analysis- This technique proves invaluable for analysing thin film coatings and other layered structures.
- Single Crystal X-ray Diffraction: Delivering the most precise structural details, single crystal XRD unveils atomic positions, bond lengths, and bond angles.
- High Pressure and Temperature Conditions: Notably, this technique extends its capabilities to determining crystal structures under high pressure and temperature conditions.
- Identify phases in metallic powders for 3D-printed components
- Analyse phases in lightweight coatings for aircraft exteriors
- Characterize phases in novel materials for aerospace applications
- Analyse crystallinity of pigment materials in car paints and coatings
- Evaluate crystallinity of catalyst materials in emission control systems
- Identify phases in components like engine parts or brake pads
- Monitor phase changes in catalysts during production
- Identify phases in formulated chemical products
- Analyse crystallinity of new materials for chemical processes
- Measure crystallinity of electrode materials in batteries
- Analyse phases in conductive inks for printed electronics
- Characterize crystalline phases in electronic components
- Develop advanced materials with specific crystal structures for ballistic protection
- Identify phases in smoke grenades or camouflage materials
- Analyse crystalline phases in materials used for weaponry or military equipment
- Characterize phases in electrode materials for lithium-ion batteries
- Analyse phases in catalysts used in fuel cells
- Identify phases in materials used for solar panels or other renewable energy technologies
- XRD analysis of materials in forensic investigations (performed by specialists)
- Identify phases in phosphor particles used in LEDs
- Analyse phases in nanoparticles used for LED coatings
- Characterize crystallinity of materials used for LED components
- Determine crystallinity of biomaterials used in medical implants
- Identify phases in drug delivery nanoparticles
- Analyse crystalline phases in biocompatible materials
- Characterize crystal structure of drug particles
- Identify polymorphs of drug compounds
- Analyse crystallinity of drug excipients
- Identify mineral phases present in raw materials
- Quantify crystallinity of raw materials
- Analyse crystalline phases in composite materials
- Analyse phases in high-purity chemicals for semiconductor manufacturing
- Identify phases in cleaning solutions for semiconductor wafers
- Characterize crystalline phases in new materials for semiconductor technology
- Characterize phases in magnetic nanoparticles for data storage devices
- Analyse phases in battery electrode materials for portable devices
- Non-destructive
- Quantitative and Rapid Analysis
- Crystallinity Assessment
- Unit Cell Determination
- Polymorphism Detection
- High Specificity
- Powder: minimum quantity 0.5 grams
- Thin Films: Minimum ~ Thickness 2mm, diameter 2 cm.
- Metals: Thickness 2mm, diameter 2 cm.