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Wavelength Dispersive Spectroscopy
Wavelength Dispersive Spectroscopy (WDS)
Wavelength Dispersive Spectroscopy (WDS) is an advanced analytical technique used to determine the elemental composition of materials with high precision and accuracy. Utilizing the principles of X-ray diffraction, WDS is particularly effective in identifying and quantifying elements in a sample by measuring the characteristic wavelengths of X-ray emissions. This technique is commonly integrated with Electron Probe Microanalyzers (EPMA) and Scanning Electron Microscopes (SEM) for detailed materials analysis.
- X-ray Generation: An electron beam is focused onto the sample, causing the emission of characteristic X-rays from the elements present.
- Diffraction and Detection: These X-rays are diffracted by a crystal with known lattice spacing, and the angles of diffraction are measured to determine the wavelengths.
- Element Identification: The specific wavelengths correspond to unique elements, allowing for precise identification and quantification.
- Materials Science: Analyzing the composition and distribution of elements in metals, ceramics, and composites.
- Geology: Determining the mineral composition and elemental distribution in geological samples.
- Semiconductor Industry: Assessing the purity and uniformity of semiconductor materials and devices.
- Forensic Analysis: Identifying trace elements and contaminants in forensic samples.
- High Precision and Accuracy: Provides accurate quantitative analysis with high spectral resolution.
- Elemental Sensitivity: Capable of detecting elements at trace levels, including light elements.
- Non-Destructive: Analyzes samples without altering their physical or chemical properties.
For accurate and reliable Wavelength Dispersive Spectroscopy (WDS) analysis, samples should be clean, flat, and polished, typically not exceeding 10 mm x 10 mm x 5 mm, and non-conductive samples should be coated with a thin conductive layer to prevent charging; ensure proper mounting and provide detailed sample information, including prior data if available, to facilitate precise and insightful analysis.