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Transmission Electron Microscopy
Types of Techniques
- Atomic Force Microscopy (AFM)
- Field Emission-Scanning Electron Microscopy (FESEM)
- Optical microscope
- Transmission Electron Microscopy (TEM)
- Scanning Acoustic microscopy
- Confocal Micro/Nano Photoluminescence Spectroscopy (PL)
- Confocal micro /nano Raman spectroscopy
- Focused Ion Beam – Scanning Electron Microscopy
- Electron Probe Micro Analysis (EPMA)
- Focused Ion Beam (FIB)
- Infinite Focus Microscopy
- Cathodo lumiscence
Transmission Electron Microscopy (TEM)
Transmission electron microscopy (TEM) is an analytical method utilized to visualize minute structures within matter. Unlike optical microscopes dependent on visible light, TEM offers exceptional detail at the atomic level, magnifying nanometer-scale structures up to 50 million times. This is made possible by the significantly shorter wavelength of electrons, approximately 100,000 times smaller than visible light, achieved through acceleration within a robust electromagnetic field, consequently enhancing microscope resolution by several orders of magnitude.
TEM operates with a high-voltage electron beam to generate images. The electron gun, positioned at the top, emits electrons that traverse a vacuum tube. Electromagnetic lenses focus the electron beam, which then passes through the ultra-thin specimen. Transmitted electrons impact a fluorescent screen positioned beneath the microscope, producing an image of the specimen and its components based on density. This resultant image can be directly examined or photographed.
- Characterization of microstructure, crystallography, and defects in materials like metals, ceramics, polymers, and composites.
- Facilitates the development of advanced materials with tailored properties.
- Visualization and characterization of nanomaterials such as nanoparticles, nanotubes, and nanowires.
- Provides insights into the size, shape, morphology, and composition of nanomaterials.
- Imaging and analysis of biological specimens at the subcellular level.
- Provides insights into the ultrastructure of cells, organelles, viruses, and biomolecules.
- Characterization of semiconductor devices, integrated circuits, and thin film materials.
- Visualizes interfaces, defects, and dopant distributions in semiconductor materials.
- Study of catalyst materials and energy storage materials like batteries and fuel cells.
- Investigation of the nanoscale structure and composition, optimizing catalytic processes and energy storage devices.
- Analysis of pollutants, particulate matter, and nanoparticles in air, water, and soil samples.
- Understanding sources, transformation, and environmental impacts of nanomaterials and pollutants.
- Study of geological materials such as minerals, rocks, and sediments.
- Provides detailed information about crystal structure, composition, and deformation mechanisms of geological samples.
- Unparalleled spatial resolution for elemental mapping among analytical techniques.
- Image resolution below 0.2 nm (2 Å).
- Provision of small-area crystallographic data.
- Distinct contrast between crystalline and amorphous materials without the need for chemical staining.
Samples must be thinned to electron transparency without introducing artifacts. They should possess electrical conductivity and be rigidly supported by the sample holder while minimizing surface damage layers.