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Infinite Focus Microscopy
Types of Techniques
- Atomic Force Microscopy (AFM)
- Field Emission-Scanning Electron Microscopy (FESEM)
- Optical microscope
- Transmission Electron Microscopy (TEM)
- Scanning Acoustic microscopy
- Confocal Micro/Nano Photoluminescence Spectroscopy (PL)
- Confocal micro /nano Raman spectroscopy
- Focused Ion Beam – Scanning Electron Microscopy
- Electron Probe Micro Analysis (EPMA)
- Focused Ion Beam (FIB)
- Infinite Focus Microscopy
- Cathodo lumiscence
Infinite Focus Microscopy
Infinite Focus Microscopy (IFM) is a cutting-edge imaging technology that provides high-resolution, three-dimensional images of a sample. It is particularly useful in fields that require detailed surface analysis and measurement, such as materials science, semiconductor inspection, and biological research.
Principle
Applications
Advantages
Sample Requirement
Principle
IFM combines optical microscopy with focus variation techniques to create high-resolution, three-dimensional images of your samples. By capturing a series of images at different focal planes, IFM reconstructs a comprehensive 3D image, highlighting the best-focused details at every point on the sample.
Applications
- Materials Science: Used to analyze surface roughness, texture, and other topographical features of materials.
- Semiconductor Industry: Helps in inspecting microelectronic components for defects and ensuring quality control.
- Biological Research: Allows detailed visualization of biological specimens, providing insights into cellular structures and functions.
Advantages
- High Resolution: Provides detailed 3D images with high lateral and vertical resolution.
- Non-Destructive: Does not damage the sample, making it suitable for delicate specimens.
- Versatile: Can be used on a variety of materials and surfaces, from metals to biological tissues.
Sample Requirement
- Dimensions: Samples should fit within the dimensions of the microscope stage. Typically, this means a maximum size of a few centimeters in both width and length.
- Height: The height of the sample should be within the focus range of the IFM system, usually up to a few millimeters.