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Cathodoluminescence
Types of Techniques
- Atomic Force Microscopy (AFM)
- Field Emission-Scanning Electron Microscopy (FESEM)
- Optical microscope
- Transmission Electron Microscopy (TEM)
- Scanning Acoustic microscopy
- Confocal Micro/Nano Photoluminescence Spectroscopy (PL)
- Confocal micro /nano Raman spectroscopy
- Focused Ion Beam – Scanning Electron Microscopy
- Electron Probe Micro Analysis (EPMA)
- Focused Ion Beam (FIB)
- Infinite Focus Microscopy
- Cathodoluminescence
Cathodoluminescence (CL)
Cathodoluminescence (CL) imaging and analysis is a powerful technique used to study the optical and electronic properties of materials at the microscopic level. By detecting the light emitted from a material when it is bombarded with electrons in a Scanning Electron Microscope (SEM), CL provides valuable insights into the composition, structure, and defects of materials. This technique is widely used in materials science, geology, semiconductor research, and nanotechnology.
- Electron Bombardment: A focused electron beam from an SEM excites the electrons in the sample.
- Light Emission: The excited electrons return to their ground state, emitting photons in the process.
- Detection: The emitted photons (cathodoluminescence) are collected and analyzed to provide information about the sample’s properties.
- Materials Science: Analyzes defects, impurities, and electronic properties of semiconductors, ceramics, and other materials.
- Geology: Identifies mineral compositions, zoning, and growth histories in geological samples.
- Semiconductor Research: Evaluates the quality of semiconductor materials and devices by examining their luminescent properties.
- Nanotechnology: Studies the optical properties of nanostructures and quantum dots.
- High Spatial Resolution: Provides detailed imaging at the nanoscale, revealing fine structural details.
- Sensitive to Defects: Detects defects, impurities, and variations in material composition.
- Non-Destructive: Analyzes samples without altering their physical or chemical properties.
Size: Samples should ideally be small enough to fit within the dimensions of the SEM chamber. Typical dimensions are no larger than 10 mm x 10 mm x 5 mm.
Thickness: Thin samples (less than 1 mm) are preferred to minimize absorption of emitted light and to ensure clear detection of CL signals.