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X-Ray fluorescence

X-Ray fluorescence (XRF)

XRF is a quick and non-destructive analytical technique used for the determination and quantification of chemical composition. This technique is suitable for the analysis of loose powders, pressed powder pellets, fused glass beads, liquids or solids. In this study, the X-ray beam is incident to the sample to evaluate the compositional information. The interaction between the incident X-ray and the sample produces the characteristic X-rays, which are used to determine the chemical composition. XRF can study the elements present in the periodic table between B to U. Trace level elemental analysis can be done for both conductive and non-conductive samples.
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