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Time of Flight Secondary Ion Mass Spectrometry
Types of Techniques
- Inductively coupled plasma-optical emission spectrometry (ICP-OES)
- UV-Vis spectroscopy
- X-Ray fluorescence (XRF)
- Atomic absorption spectroscopy (AAS)
- Time-Resolved Photoluminescence Spectroscopy (TRPL)
- X-Ray Photoelectron Spectroscopy (XPS)
- Auger Electron Spectroscopy (AES)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Atomic Fluorescence Spectroscopy (AFS)
- Infrared (IR) spectroscopy
- Nuclear Magnetic Resonance Spectroscopy
- Time of Flight Secondary Ion Mass Spectrometry (Tof-SIMS)
- Spectrophotometer
- Mössbauer Spectroscopy
- ultra violet photoelectron spectroscopy
- Electron Paramagnetic Resonance (EPR)
- Glow Discharge Optical Emission Spectrometry
- X-ray Reflectivity (XRR)
- Total Reflection-TXRF
- Ion scattering spectroscopy (ISS)
- Rutherford Backscattering Spectrometry (RBS)
- ToF Elestic Recoil Detection
- Spectroscopic Ellipsometry
Time of Flight Secondary Ion Mass Spectrometry (Tof-SIMS)
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that utilizes a pulsed ion beam to remove molecules from the outermost surface of a sample. The mass of these particles is determined by measuring the exact time they reach the detector, offering capabilities like mass resolution, mass range, and trace element detection limits.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) works based on the principle that the impact of the primary ion beam sets off a collision cascade within the sample, dislodging atoms and molecules from the surface. A portion of these ejected particles transform into secondary ions, carrying the chemical signature of the original material. ToF-SIMS leverages a time-of-flight mass analyzer to meticulously separate these secondary ions. The time it takes for an ion to reach the detector is directly proportional to its mass-to-charge ratio. By measuring this time, ToF-SIMS can decipher the identity of the ion and reconstruct the intricate chemical composition of the surface.
- Failure Analysis of Composite Materials
- Identification of Contaminants on Spacecraft Components
- Examination of Lubrication Efficiency in Extreme Environments
- Characterizing Lubricant and Coating Surfaces
- Investigating Adhesive Bonding
- Chemical Mapping of Corrosion Processes
- Catalysts under the Microscope
- Demystifying Surface Segregation Phenomena
- Unveiling Polymer Blends
- Eradicating Organic Contaminants
- Depth Profiling of Thin Films
- Failure Analysis of Electronic Components
- Characterization of Military Coatings
- Trace Evidence Analysis in Forensics
- Analysis of Degradation Mechanisms in Military Materials
- Evaluation of Battery Electrode Materials
- Analysis of Corrosion Products in Energy Infrastructure
- Characterization of Fuel Cell Catalysts
- Failure Analysis in Forensics
- Identification of Trace Materials on Questioned Documents
- Analysis of Paint Chips and Other Trace Evidence
- Analysis of Dopant Profiles
- Characterization of Surface Defects
- Biocompatibility Testing of Implants
- Analysis of Surface Modifications for Drug Delivery
- Characterization of Drug Delivery Formulations
- Analysis of Protein Adsorption on Surfaces
- Identification of Impurities and Contaminants
- Characterization of Mineral Surfaces
- Analysis of Dopant Profiles and Interfaces
- Characterization of Gate Dielectrics
- Analysis of Thin Film Coatings in Magnetic Recording Media
- Characterization of Surface Contaminants on Optical Components
- High surface sensitivity: ToF-SIMS can detect elements and molecules present at very low concentrations on the surface.
- Chemical specificity: The technique can differentiate between different chemical species with similar masses.
- Lateral and depth profiling capabilities: ToF-SIMS can create chemical images of the surface and analyze the composition as a function of depth.
- Sample size ~ 8 cm².
- Sample height ~ 2 cm.
- The sample must be compatible with ultra-high vacuum (>1×10⁻⁹ Torr).