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Glow Discharge Optical Emission Spectrometer
Types of Techniques
- Inductively coupled plasma-optical emission spectrometry (ICP-OES)
- UV-Vis spectroscopy
- X-Ray fluorescence (XRF)
- Atomic absorption spectroscopy (AAS)
- Time-Resolved Photoluminescence Spectroscopy (TRPL)
- X-Ray Photoelectron Spectroscopy (XPS)
- Auger Electron Spectroscopy (AES)
- Fourier Transform Infrared Spectroscopy (FTIR)
- Atomic Fluorescence Spectroscopy (AFS)
- Infrared (IR) spectroscopy
- Nuclear Magnetic Resonance Spectroscopy
- Time of Flight Secondary Ion Mass Spectrometry (Tof-SIMS)
- Spectrophotometer
- Mössbauer Spectroscopy
- ultra violet photoelectron spectroscopy
- Electron Paramagnetic Resonance (EPR)
- Glow Discharge Optical Emission Spectrometry
- X-ray Reflectivity (XRR)
- Total Reflection-TXRF
- Ion scattering spectroscopy (ISS)
- Rutherford Backscattering Spectrometry (RBS)
- ToF Elestic Recoil Detection
- Spectroscopic Ellipsometry
Glow Discharge Optical Emission Spectrometry
Glow-discharge optical emission spectroscopy (GDOES) is an analytical technique used for determining the chemical composition, layer thickness, and concentration gradients in solid samples. It is particularly useful for analyzing thin films, coatings, and layered materials. GDOES offers high sensitivity, a wide elemental range, and the ability to detect trace elements, making it a valuable tool in various industries.
Principle
Applications
Advantages
Sample Requirement
Principle
The working principle of GDOES involves creating a glow discharge plasma by applying a high voltage between the sample (acting as the cathode) and an anode in an argon gas environment. The argon ions are accelerated towards the sample surface, causing sputtering and releasing atoms from the sample. These sputtered atoms become excited in the plasma and emit characteristic light when transitioning back to their ground states. The emitted light is analyzed using a spectrometer, and the intensity of the spectral lines is proportional to the concentration of the corresponding elements in the sample.
Applications
Aerospace:
- Analysis of coating thickness and composition on aircraft components
- Examination of surface treatments and coatings on aerospace materials
- Characterization of alloys and composites used in aircraft and spacecraft
- Analysis of surface treatments, coatings, and platings on automotive parts
- Examination of corrosion resistance and wear properties of automotive materials
- Characterization of engine components and exhaust systems
- Analysis of catalyst materials and chemical reactors
- Examination of coatings and surface treatments on chemical processing equipment
- Characterization of polymers, resins, and other chemical products
- Analysis of coatings and surface treatments on electronic components
- Examination of thin-film materials in semiconductor devices
- Characterization of materials used in display technologies
- Analysis of coatings and surface treatments on military equipment and vehicles
- Examination of materials used in munitions and explosives
- Characterization of protective coatings and materials for defence applications
- Analysis of coatings and surface treatments on energy generation equipment
- Examination of materials used in solar cells and fuel cells
- Characterization of materials used in energy storage devices (batteries, capacitors)
- Analysis of materials and coatings in product failure investigations
- Examination of evidence in forensic investigations
- Characterization of materials in intellectual property disputes
- Analysis of coatings and materials used in LED and lighting applications
- Examination of phosphor materials and light-emitting materials
- Characterization of materials used in lighting and display technologies
- Analysis of coatings and surface treatments on medical implants and devices
- Examination of biocompatible materials and coatings
- Characterization of materials used in medical instrumentation
- Analysis of coatings and materials used in pharmaceutical packaging
- Examination of drug delivery systems and controlled-release coatings
- Characterization of materials used in pharmaceutical manufacturing equipment
- Analysis of coatings and surface treatments on raw materials
- Examination of impurities and contaminants in raw materials
- Characterization of raw materials used in various industries
- Analysis of thin-film materials and coatings in semiconductor devices
- Examination of materials used in integrated circuits and microelectronics
- Characterization of materials used in semiconductor manufacturing processes
- Analysis of coatings and materials used in telecommunication components
- Examination of materials used in data storage devices (hard disks, optical discs)
- Characterization of materials used in fiber optic communications
Advantages
- Simultaneous multi-element analysis
- High sensitivity and low detection limits
- Wide range of detectable elements, including light elements
- Depth profiling capabilities with nanometer resolution
- Quantitative and qualitative analysis
- Fast analysis time
- Non-destructive for most samples
Sample Requirement
- Sample Size: Typically, a flat sample with a surface area of at least 4-10 mm in diameter is required.
- Sample Quantity: A single sample is typically sufficient for GDOES analysis, although multiple samples may be needed for some applications.
- Sample Preparation: The sample surface should be clean and free from contaminants. Minimal sample preparation is usually required.