Confocal Micro/Nano Photoluminescence Spectroscopy
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- Confocal Micro/Nano Photoluminescence Spectroscopy
Types of Techniques
- Atomic Force Microscopy (AFM)
- Field Emission-Scanning Electron Microscopy (FESEM)
- Optical microscope
- Transmission Electron Microscopy (TEM)
- Scanning Acoustic microscopy
- Confocal Micro/Nano Photoluminescence Spectroscopy (PL)
- Confocal micro /nano Raman spectroscopy
- Focused Ion Beam – Scanning Electron Microscopy
- Electron Probe Micro Analysis (EPMA)
- Focused Ion Beam (FIB)
- Infinite Focus Microscopy
- Cathodo lumiscence
Confocal Micro/Nano Photoluminescence Spectroscopy (PL)

Confocal Micro Photoluminescence Spectroscopy (PL) is an advanced analytical technique that combines the principles of photoluminescence spectroscopy with confocal microscopy. This technique allows for the characterization of luminescent properties of materials with high spatial resolution, enabling the analysis of microscopic regions or individual nanostructures within a sample.
Confocal Micro Photoluminescence Spectroscopy operates on the principles of photoluminescence, where a sample is excited by a monochromatic light source, typically a laser. The incident light is absorbed by the sample, promoting electrons to higher energy levels. When these excited electrons relax back to their ground state, they emit photons with energies corresponding to the energy difference between the excited and ground states.
In a confocal microscope setup, the excitation light is focused onto a small spot within the sample using an objective lens. The emitted photoluminescence from this spot is then collected by the same objective lens and passed through a pinhole aperture. This pinhole rejects out-of-focus light, allowing only the in-focus photoluminescence signal from the focal plane to reach the detector.
By raster-scanning the focused laser spot across the sample and recording the photoluminescence signal at each point, a high-resolution photoluminescence map of the sample can be constructed. This confocal approach provides exceptional spatial resolution, typically in the range of a few hundred nanometers or even better, depending on the wavelength of the excitation light and the numerical aperture of the objective lens.
- Characterization of photoluminescent coatings and paints
- Analysis of defects in composite materials
- Investigation of stress-induced luminescence in aerospace alloys
- Characterization of luminescent materials in automotive lighting
- Analysis of photoluminescent coatings for corrosion protection
- Investigation of defects in automotive coatings and paints
- Characterization of luminescent dyes and markers
- Analysis of photoluminescent impurities in chemical products
- Investigation of photoluminescence in catalytic materials
- Characterization of luminescent materials in display technologies
- Analysis of defects in semiconductor devices
- Investigation of photoluminescence in optoelectronic components
- Characterization of luminescent markers and tracers
- Analysis of defects in stealth coatings
- Investigation of photoluminescence in explosive materials
- Characterization of luminescent materials in solar cells
- Analysis of defects in photovoltaic materials
- Investigation of photoluminescence in energy storage materials
- Characterization of luminescent fingerprints and traces
- Analysis of photoluminescent evidence in forensic investigations
- Investigation of counterfeit products using photoluminescence
- Characterization of luminescent materials in LED devices
- Analysis of defects in phosphor coatings
- Investigation of photoluminescence in light-emitting materials
- Characterization of luminescent biomarkers and probes
- Analysis of defects in medical implants
- Investigation of photoluminescence in tissue imaging
- Characterization of luminescent drugs and drug delivery systems
- Analysis of photoluminescent impurities in pharmaceutical products
- Investigation of photoluminescence in biomedical imaging
- Characterization of luminescent minerals and gemstones
- Analysis of defects in raw materials for various industries
- Investigation of photoluminescence in material processing
- Characterization of luminescent semiconductor materials
- Analysis of defects in semiconductor devices
- Investigation of photoluminescence in optoelectronic devices
- Characterization of luminescent materials in optical fibers
- Analysis of defects in optical components
- Investigation of photoluminescence in data storage media
- High spatial resolution, enabling the analysis of microscopic regions and individual nanostructures
- Non-destructive and non-invasive technique
- Provides information about electronic and optical properties of materials
- Capable of mapping photoluminescence properties across a sample
- Compatible with a wide range of materials, including solids, liquids, and thin films
- Can be combined with other techniques, such as Raman spectroscopy, for comprehensive characterization
- Solids, liquids, and organic and inorganic gels can be measured.
- Liquid – minimum 5 ml.
- Thin films – 1 cm².